Pretoria, South Africa
Albertyn Barnard received the degrees M Eng (Electronics) and M Eng (Engineering Management) from the University of Pretoria. He has provided consulting services in systems and reliability engineering to the defence, nuclear, aerospace and commercial industries since 1982. He provides training in reliability engineering to industry and at post-graduate level at the University of Pretoria. He has presented numerous technical papers at symposia, and won the Best Paper Award at the 2004 INCOSE SA conference (South Africa), as well as the Gold Award at the 2009 International Applied Reliability Symposium Europe (Spain).
He has been a member of the management committee of INCOSE SA for a number of years, served as President of INCOSE SA in 2008, and established the INCOSE Reliability Engineering Working Group in 2011. He is currently leading this working group, which focuses on reliability engineering from a systems engineering viewpoint.
His company, Lambda Consulting, specialises in reliability engineering activities applicable to the development phase of products, with emphasis on reliability analysis of electronic design and HALT (Highly Accelerated Life Testing). Lambda Consulting established the first commercial HALT laboratory in South Africa in 2008.
Consulting and Management
Reliability engineering management
Reliability programme development
Product failure investigation
Commercial HALT (Highly Accelerated Life Testing) laboratory
Systems reliability analysis and modelling
Worst case circuit analysis
Component derating analysis
Design FMEA (failure mode and effects analysis)
Reliability Engineering Training Courses
Reliability for Electronic Designers
Reliability for Engineering Managers
Laguna Hills, California
Instructor/Consultant – HALT & HASS + Workshop – Mastering HALT & HASS
Aldo Fucinari has 35 years’ experience in design validation testing, electrical engineering and environmental testing and holds a BSCE degree in Computer Engineering. He has worked in various fields of engineering including computer peripheral storage, automotive and systems engineering. Aldo is currently chief consultant for RapidDiscoverySystems.com environmental testing consultants and is partnered with Hobbs Engineering and Quality Testing Services to provide end to end HALT, HASS and specialized environmental testing solutions. Now as an independent environmental reliability testing consultant he is involved with world-class companies in bio-medical, computer, defense and automotive products.
At Seagate Aldo was part of the initial deployment of Seagate’s Design for Six Sigma program where he received certification as a Master Black Belt in DFSS and a Black Belt in Six Sigma process and transactional process.
Aldo is currently senior consultant at his company Rapid Discovery Systems rapiddiscoverysystems.com. At Emulex Aldo was global quality manager with responsibility for supplier quality performance of 4 source assembly factories supplying product direct to stock to major computer companies worldwide. Aldo has long-term experience with suppliers that are equipped to do full HASS and HASA testing. Now as an independent environmental reliability testing consultant he is involved with world-class companies in bio-medical, defense and automotive products. He is also a leading adopter of lean product development methods and design for manufacturability.
Aldo is a senior member of ASQ and a member of the Lean Product and Process Development Exchange.
Instructor/Consultant: Shock & Vibration Test , Design & Design Assurance – Design for Reliability and Quality
Author: Design for Reliability Thermodynamic Degradation Science – Physics of Failure, Accelerated Testing, Fatigue and Reliability Applications.
Dr. Feinberg has a Ph.D. in Physics and is the author of the books, Design for Reliability and Thermodynamic Degradation Science – Physics of Failure, Accelerated Testing, Fatigue and Reliability Applications. Alec has provided reliability engineering services in all areas of reliability and on numerous products in diverse industries that include solar, thin film power electronics, defense, microelectronics, aerospace, wireless electronics, and automotive electrical systems. He has provided training classes in Design for Reliability, Shock and Vibration, HALT, Reliability Growth, Electrostatic Discharge, DFMEA, and Physics of Failure. Alec has presented numerous technical papers and won the 2003 RAMS Alan O. Plait best tutorial award for the topic, Thermodynamic Reliability Engineering.
Alec helps companies jump start their reliability programs, providing software that makes reliability test and analysis easier. Consulting services available include the following:
Reliability Test and Analysis
Reliability Analysis in all areas
HALT Systems reliability analysis and modeling
Component derating analysis
Design FMEA (failure mode and effects analysis)
Los Angeles, California
Instructor/Consultant: Cooling Techniques for Electronic Equipment
Preventing Thermal & Vibration Failures, Using Finite Element Analysis with Electronic Equipment: Thermal Cycling, Heat Transfer and Vibration Analysis
Steven Carlson has over 20 years of extensive experience in defense/aerospace industry dealing with design and analysis of electronic hardware with a strong understanding of thermal and structural analysis. He is the principal engineer at Carlson Mechanical Engineering and has provided mechanical analysis services to Northrop Grumman, Physical Optics Corporation, and multiple other electronic manufacturers for military and commercial applications. Steve holds a Masters in Mechanical Engineering and currently works at Jet Propulsion Laboratory (JPL) performing thermal and structural analyses on space based electronic hardware.
Steve learned the classical techniques for analyzing electronic hardware from Joel Sloan (author Design and Packaging of Electronic Equipment) who was a colleague of Dave Steinberg (author of multiple thermal and vibration analysis books) at Litton Guidance and Control Systems. Steve has expanded the classical techniques to include modern solid modeling and Finite Element Analysis to reduce analysis time, improve accuracy, and decrease product development time.
He worked under the mentorship of Joel Sloan at Litton Guidance and Control Systems on navigation grade systems (LN-100, LN-200, and LN25x) and development programs (Fiber Optic Gyro and Silicon Accelerometer). Steve has worked on multiple flight programs at JPL including the Mars Science Laboratory and Juno performing heat transfer and vibration analyses on electronic hardware at component and system level.
St Louis, Missouri
John Paschkewitz has over 41 years experience in product assurance, testing, reliability and sustaining engineering in several industries including hydraulic truck cranes and excavators, military and civil aircraft airframe and avionics, photocopiers, elevators and escalators, heaters, temperature sensors and controls. From a supplier perspective, this includes ensuring component reliability for customers in semiconductor equipment, medical device, commercial cooking equipment, and diesel emissions control industries.
He holds a B.S. in Mechanical Engineering and a Masters in Engineering Professional Development from the University of Wisconsin – Madison and a M.A. in Business Management from Central Michigan University. He is a registered Professional Engineer and an ASQ Certified Reliability Engineer. He is a senior member of ASQ, and a member of SAE and ASME.
John has made presentations at the Applied Reliability Symposium in 2007, 2009, 2010, and 2011.
Areas of interest and expertise include:
– Reliability Requirements and Needs definition
– Integrating Reliability into Lean Product Development
– Verification and Validation planning and testing
– HALT and HASS applied to electronic, electrical and mechanical components
– Failure analysis methods and lab operation
– Reliability test lab planning and operation
– Design for reliability and GD3 (Good Design, Good Discussion, Good Dissection)
– Design Review based on Failure Modes / Design Review based on Test Results (DRBFM / DRBTR) tailored to the needs of different industries as a complement to or substitute for FMEA, particularly outside of the automotive and aerospace industries where requirements for FMEA are less structured.
– Sustaining engineering and evaluation of fielded products
– Application of reliability analysis software tools for Weibull and life data analysis, quantitative accelerated life test analysis, and design of experiments planning and analysis
– Practical approaches to quality, reliability and durability assurance
Professor Bernstein completed his Ph.D from MIT in 1990. Afterwards, he started his reliability research career at MIT Lincoln Laboratories and joined the faculty of University of Maryland to teach in the Reliability program. His expertise lies in several areas of micro and macro electronic device reliability and physics of failure research including packaging, system reliability modeling, gate oxide integrity, radiation effects, MEMS and laser programmable metal interconnect. He directs the Laboratory for Reliable Integrated Electronics. This Laboratory is a center of research activity dedicated to serving the needs of manufacturers of highly reliable electronic systems using commercially available off the shelf parts. Research areas include thermal, mechanical, and electrical interactions of failure mechanisms of ultra-thin gate dielectrics, next generation metallization and power devices. He also works extensively with the semiconductor industry on projects relating to laser processing for defect avoidance, programmable interconnect used in Field Programmable Analog Arrays and repair in microelectronic circuits and packaging. Professor Bernstein was a Fulbright Senior Researcher/Lecturer at Tel Aviv University in the Department of Electrical Engineering, Physical Electronics. Professor Bernstein is a senior member of IEEE.Professor Bernstein has authored several books on reliability. His latest, entitled: Reliability Prediction from Burn-In Data Fit to Reliability Models (Elsevier Academic Press, 2014) is the basis for his combination of failure mechanisms theory. He works extensively with military standards on Aerospace and Satellite reliability using off-the-shelf parts. He has research contracts with the US Navy and Air Force. Professor Bernstein has successfully implemented reliability programs that improves mean time-to-fail (MTTF) and can successfully apply algorithms that will actually predict reliability based on accelerated tests. He has expertise also in burn-in and failure analysis. He has also developed software implementation of the Multiple Failure Mechanism model for reliability simulation and prediction with BQR Software. They expect to deliver the first complete reliability simulation package by January 2014. This software will implement reliability calculations for advanced CMOS and semiconductor devices as a module in their FixStress Software package.
Montclair, New Jersey
Instructor/Consultant: Lead-Free Solder Joint Reliability
Jean-Paul Clech, founder and principal of EPSI Inc. (since 1995), is a materials / mechanical / electronic packaging engineer. He consults in the areas of circuit board and surface component design and assembly, electronic packaging (SMT, BGA, CSP, Flip-Chip etc…), assembly quality and reliability, for clients across the electronics industry worldwide. He also assists law firms in patent or product litigation cases. Jean-Paul is the principal developer of the Solder Reliability Solutions (SRS) model and software for reliability assessment of SnPb electronic assemblies and has consulted on the design of small to large circuit boards and components in low to high reliability applications. His current research interests are in harsh environments, lead-free properties and reliability, and flexing and vibration of circuit boards. Jean-Paul previously was a member of technical staff and then consultant at AT&T Bell Laboratories (1985-90 and 1992-95). He also worked as manager of electronic packaging at a super-computer start-up company in France (1990-92), with main responsibilities for electronic packaging and cooling of a multi-chip, multi-processor Central Processor Unit (CPU).
He received the Diplôme d’ Ingénieur (Materials Science major) from Ecole Centrale de Paris, France, in 1981 and M.S. and Ph.D. degrees in Mechanical Engineering from Northwestern University, Evanston, IL., in 1982 and 1985, respectively. He has authored over 45 papers and three book chapters, and has been a workshop instructor and invited speaker at corporations and various venues in Asia, Europe and North America. He is an active member of ASME, IEEE, IMAPS, SMTA and TMS and serves as a reviewer of several of those societies’ technical journals.
In 2003, Jean-Paul received the Member of Distinction Award from the Surface Mount Technology Association (SMTA). In 2006, he was presented with the IPC’s Distinguished Committee Service award in appreciation and recognition of his contribution to the development of IPC-9701A, Performance Test Methods and Qualification Requirements for Surface Mount Solder Attachments. In 2009, he was rated as a “Speaker of Distinction” by the technical program committee of the Surface Mount Technology Association International (SMTAI) Conference. His 2009 SMTAI paper: “Closed form, strain energy based acceleration factors for thermal cycling of lead-free assemblies“, by J-P. Clech, Ph. D., Henshall, G., Ph. D. and Miremadi, J., presented with co-authors from the Hewlett-Packard Corporation at the 2009 SMTA International (SMTAI) conference, received the SMTAI Conference Best of Proceedings Award.
College Park, Maryland
Instructor/Consultant: Physics of Failure
Abhijit Dasgupta, Professor of Mechanical Engineering at the University of Maryland, has conducted over 20 years of research on Physics of Failure (PoF) approaches for developing reliable, complex multi-functional systems that perform electronic, photonic, and mechanical functions. This research, sponsored by a consortium of leading electronics builders/users at the Center for Advanced Life Cycle Engineering (CALCE), focuses on industry-relevant projects in reliability assurance of electronic systems, MEMS, sensors, actuators, and ‘smart’ composite systems. Examples include avoidance of failures caused by thermal and power cycling, multi-DoF vibration, shock/drop, combined stresses. He applies these PoF principles to develop effective virtual qualification tools, for optimizing manufacturing process windows, for real-time health monitoring and prognostics, and for devising quantitative accelerated testing strategies used in qualification and quality assurance of complex electronic and electromechanical systems. He has consulted for many major electronics manufacturers, published over 250 journal articles and conference papers on these topics, presented over 35 short workshops nationally and internationally, served on the editorial boards of three different international journals, organized several national and international conferences, and received seven awards for his contributions in materials engineering research and education. He has critically evaluated the use of HALT/HASS test methods and has presented PoF seminars and workshops at Hobbs Engineering over the past 15 years.
Dr. Montgomery is Regents’ Professor and the ASU Foundation Professor of Engineering, and a Member of the Committee on Statistics at Arizona State University. He held the John M. Fluke Distinguished Chair in Engineering, was the Director of Industrial Engineering and Professor of Mechanical Engineering at the University of Washington in Seattle. He was a Professor of Industrial & Systems Engineering at the Georgia Institute of Technology. He holds BSIE, MS and Ph.D. degrees from Virginia Polytechnic Institute.
Professor Montgomery’s professional interests are in industrial statistics, including design of experiments, quality control, applications of linear models, and time series analysis and forecasting. He also has interests in operations research and statistical methods applied to modeling and analyzing manufacturing systems. He has lectured extensively throughout the Americas, Europe and the Far East.
Professor Montgomery is an author of thirteen textbooks that have appeared in over 35 English editions and numerous foreign languages, including Design and Analysis of Experiments, 7th edition (2009) and Introduction to Statistical Quality Control, 6th edition (2009). He has edited or coauthored seven other research books or edited volumes. His research papers have appeared in many journals.
Schenectady, New York
Instructor/Consultant: Accelerated Test Data Analysis
Wayne Nelson consults on diverse applications of engineering data analysis to extract information that improves products. In addition to being a leading expert in the collection and analysis of product reliability data from field service, laboratory tests, and accelerated tests, Dr. Nelson is skilled in statistical analysis and modeling of data on measurement errors, and data from designed experiments and from samples from populations. At General Electric R&D from 1965 to 1989 and as a private consultant since, he has contributed to improving product performance and reliability in many industries including Aviation, Automotive, Electric Power, Medical Devices, Nuclear Power, Military Hardware, Railroad, Electronics, Microelectronics, Transportation, Materials, and Software. He is widely recognized for his innovative developments that solve nonstandard client applications. These developments appear in his three books and 130 literature articles. He also trains engineers on data analysis and works as an expert witness.
In recognition of his innovative developments for practical applications and his contributions to reliability education, he was elected a Fellow of the Institute of Electrical and Electronics Engineers (IEEE), the Amer. Society for Quality (ASQ), and the Amer. Statistical Assoc. (ASA). The ASQ awarded him the Shewhart Medal, Brumbaugh Award, Wilcoxon Prize, Youden Prize, and Shainin Medal. The IEEE Reliability Division awarded him its prestigious Lifetime Achievement Award.