Webinar: Reliability Prediction Based on Multiple Accelerated Life Tests by Professor Joseph Bernstein
Reliability Prediction Based on Multiple Accelerated Life Tests by Professor Joseph Bernstein Join us for a webinar on Jan 24, 2018 at 8:30 – 10:30 AM PST. Cost $200 per person, Group discounts available! Register now! https://attendee.gotowebinar.com/register/9046918398254407937 To this day, the users of our most sophisticated electronic systems that include opto-electronic, photonic, MEMS device, etc. […]