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NEW HALT & HASS WEBINAR! Rapid and Robust Reliability Development – 2022 HALT & HASS Online Seminar by Kirk Gray
July 19, 2022 @ 8:30 am - July 20, 2022 @ 12:30 pm
$800
New Two half-day Webinar! Rapid and Robust Reliability Development – 2022 HALT & HASS webinar by Kirk Gray
Join us for a NEW HALT & HASS webinar on July 19-20th, 2022 8:30 am-12:30 pm Pacific time (California) Cost $800 per person, group discounts available. Attendees must participate in both days for the complete course. This course will be recorded and can be purchased to view at a time more convenient for you. Contact us for details.
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Webinar Objective: This 8-hour webinar, presented over two days, gives valuable insight into saving your company millions of dollars in lost opportunity by prevention of latent product defects. You will get to market faster and delight your customers by producing consistent high-quality products. Participants will obtain a deeper understanding of what the HALT and HASS methodology do for process and product maturity in an organization and will enable better integration of these methods into the design and manufacturing processes, respectively. The instructor invites high level management as well as engineers to attend. Please send questions in advance on what you would like most to understand more about the HALT and HASS approach and methodology.
Course Outline:
Traditional Reliability Engineering History – the need for a new frame of reference in reliability development.
- History of models, formulas, and predictions used and for new product development
- Why reliability models and predictions in most cases is misleading approach for early reliability development engineering of new systems
- Why there is very little published data on causes of failures and successful HALT case histories.
Failure Mechanisms and Environmental Stress
- Wear out modes in electronics and stress – How much life exists and how much is needed in electronic hardware?
- Acceleration of electronic lifetimes – Can we estimate field life or MTBF from HALT?
- Components and stress stimuli to accelerate fatigue damage and aging
- Systems and stress stimuli – why HALT has to be uniquely adapted for each type of product and system
Common Understanding and support are critical to HALT and HASS implementation.
- HALT is a common term widely misunderstood by many.
- Change from failure prediction to weakness discovery, simulation to stimulation.
- Serial education of critical test team members and management may create FUD (Fear, Uncertainty and Doubt)
- Winning the hearts and minds of HALT skeptics – potential methods to demonstrate its value
Highly Accelerated Life Testing (HALT)
- How high a level of stress is high enough?
- Are failures under high levels of stress relevant to field reliability?
- What equipment and personnel are needed?
- Why some HALT evaluations do not require a chamber – HALT is a method not a chamber
- Step Stress test, at what point in the design for manufacture? At what assembly level?
- What data should we gather and how should we analyze it?
Use of Stress in Design Evaluation and Improvement
- Applying and monitoring during thermal and vibration step stress
- Thermal Cycling, voltage and frequency margining, power cycling and other stresses for HALT
- When to use single and combinations of stresses in HALT and HASS
Highly Accelerated Stress Screens (HASS)
- Development and determination of appropriate stimuli levels
- Proof of Screen – How do we test to insure we don’t damage good products?
- Highly Accelerated Stress Audits (HASA)
- Examples of electronic systems HASS processes
Thermal HALT and Discovery of Software, Firmware and Signal Integrity issues in digital systems
- Thermal skewing of device parametrics, timing and stimulation of potential variations in PWA hardware, signal propagation.
- Thermal HALT stimulation of hardware manufacturing variations that may lead to intermittent software failures
Concerns and long-term improvements in HALT and HASS
- When to start or stop HASS?
- Optimizing the vibration and thermal fixturing – the least is best.
- Feedback from screening and long-term process improvement
Specific Application of HALT and HASS on Company Products
- Review of verified field failures or history of past testing
- Best potential application of HALT on components, sub-systems, and systems
- Case histories of HALT and HASS Successes
About your instructor: Kirk A. Gray, BSEE and IEEE Senior Life Member
Kirk Gray has over 40 years of experience in the electronics manufacturing industry. Mr. Gray began his career in electronics at the semiconductor manufacturing process level and worked on reliability development of new systems.
He was the Environmental Stress Screening (ESS) Process Engineering Manager in manufacturing test at Storage Technology from 1989 to 1992, where he worked closely with Dr. Gregg K. Hobbs Ph. D, PE, the inventor of the terms and techniques HALT and HASS. Mr. Gray’s ESS process engineering team applied the HALT and HASS process and procedures into existing manufacturing production of data storage systems. He was a guest speaker at many of Gregg Hobbs HALT and HASS seminars and worked closely with Dr. Hobbs for a year at Qualmark.
AcceleRel Engineering, Inc. was his first consulting company in 1994-2001 and in 2010 he started Accelerated Reliability Solutions, L.L.C. after 7 years as a Senior Test Engineer at Dell Inc. where he created internal classes on HALT methods and developed new HALT based test processes for desktop and portable computers
He is a Senior Lifetime Member of the IEEE and a collaborator with the University of Maryland’s CALCE (Center for Advanced Life Cycle Engineering), the academic world leader in PoF (Physics of Failure) based reliability education. Kirk has co-authored the book with John J. Paschkewitz, Next Generation HALT and HASS: Robust Design of Electronics and Systems, Published in 2016 by John Wiley and Sons
Cost: $800 per person. If you have five or more from the same company the price is $720 per person
After registering, you will receive a confirmation email containing information about joining the webinar.