Deven Subramoney

Deven Subramoney

Consultant (Outside The United States of America)

Deven Subramoney, Consultant, New Zealand

Deven Subramoney has over 30 years solid experience in the field of Reliability Engineering for multiple product development and manufacturing companies working both in South Africa and New Zealand. His experience covers a broad range of electrical, electronic and mechanical products. Deven has spearheaded the setup and growth of reliability functions at many companies focusing on the development of the reliability process, reliability engineering labs, engineers and integration into the business.

Deven’s extensive knowledge and experience with designing reliability functions and especially witnessing them mature over time, allows him to assist companies in developing effective reliability processes from ground up or thoroughly evaluate existing reliability functions making recommendations for improvements based on revealing areas of weaknesses and strengths.  Deven is a certified reliability professional CRP and reliability country councillor for NZ under ASQ.  BSc Electronics Princeton University and Senior member of ASQ Reliability division.

Deven can provide expertise for:

  • Reliability Integration.
  • Structuring a Reliability Program for new products or changes made to an existing product.
  • Components, subsystems and system Reliability Allocation.
  • Implementing Highly Accelerated Life Testing (HALT), Accelerated Life Testing (ALT), Degradation Analysis (DA), Reliability Demonstration Testing (RDT) and Physics of Failure (POF).
  • Developing profiles for Production Screens – Highly Accelerated Stress Screening (HASS) or Environmental Stress Screening (ESS).
  • Life Data Analysis which provides many benefits; such as, benchmarking against design prediction, predicting warranty returns (incurred warranty costs), planning warranty reserves and assessing effectiveness of design changes.
  • Training in Reliability Program Development, HALT & HASS, Accelerated Life Testing, Reliability Demonstration Testing, Reliability Statistics and Life Data Analysis.