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8:30 am

Webinar Reliability Prediction Based on Multiple Accelerated Life Tests by Professor Joseph Bernstein

January 22 @ 8:30 am - 10:30 am
$200

Reliability Prediction Based on Multiple Accelerated Life Tests by Professor Joseph Bernstein Join us for a webinar on January 22, 2020 at 8:30 – 10:30 AM PST. Cost $200 per person, Group discounts available! Register now!  https://attendee.gotowebinar.com/register/7535195478685092353 To this day, the users of our most sophisticated electronic systems that include opto-electronic, photonic, MEMS device, etc. […]

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