Rapid and Robust Reliability Development – 2022 HALT & HASS Methodologies Online Seminar by Kirk Gray 7/19-20/2022 $800 per person
Webinar Objective: This 8-hour webinar, presented over two days, gives valuable insight into saving your company millions of dollars in lost opportunity by prevention of latent product defects. You will get to market faster and delight your customers by producing consistent high-quality products. Participants will obtain a deeper understanding of what the HALT and HASS methodology do for process and product maturity in an organization and will enable better integration of these methods into the design and manufacturing processes, respectively. The instructor invites high level management as well as engineers to attend. Please send questions in advance on what you would like most to understand more about the HALT and HASS approach and methodology.
Course Outline:
Traditional Reliability Engineering History and the new frame of reference for reliability in electronics and systems.
Use of Stress in Design Evaluation and Improvement
Failure Mechanisms and Environmental Stress
How a Common Understanding and support are needed for HALT and HASS implementation.
Highly Accelerated Life Testing (HALT)
Highly Accelerated Stress Screens (HASS)
Thermal HALT and Discovery of Software, Firmware and Signal Integrity issues in digital systems
Concerns and long-term improvements in HALT and HASS
Examples and Case histories with HALT and HASS
About your instructor: Kirk A. Gray, BSEE and IEEE Senior Life Member
Kirk Gray has over 40 years of experience in the electronics manufacturing industry. Mr. Gray began his career in electronics at the semiconductor manufacturing process level and worked on reliability development of new systems. He was the Environmental Stress Screening (ESS) Process Engineering Manager in manufacturing test at Storage Technology from 1989 to 1992, where he worked closely with Dr. Gregg K. Hobbs Ph. D, PE, the inventor of the terms and techniques HALT and HASS. Mr. Gray’s ESS process engineering team applied the HALT and HASS process and procedures into existing manufacturing production of data storage systems. He was a guest speaker at many of Gregg Hobbs HALT and HASS seminars and worked closely with Dr. Hobbs for a year at Qualmark.
AcceleRel Engineering, Inc. was his first consulting company in 1994-2001 and in 2010 he started Accelerated Reliability Solutions, L.L.C. after 7 years as a Senior Test Engineer at Dell Inc. where he created internal classes on HALT methods and developed new HALT based test processes for desktop and portable computers. He is a Senior Lifetime Member of the IEEE and a collaborator with the University of Maryland’s CALCE (Center for Advanced Life Cycle Engineering), the academic world leader in PoF (Physics of Failure) based reliability education. Kirk has co-authored the book with John J. Paschkewitz, Next Generation HALT and HASS: Robust Design of Electronics and Systems, Published in 2016 by John Wiley and Sons
Cost: $800 per person. If you have five or more from the same company, the price is $720 per person
To purchase this webinar recording link contact with the link below or call 303 655 3051 or email [email protected]
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